Skip to the main content.

In-Depth Insights into STEM Research and Innovation 

Latest Developments in STEM: Trends and Technologies

Filter all posts by tag
4D-STEM TESCAN TENSOR Phase mapping Electron Microscopy Material characterization Materials Science Orientation Analysis 3DED 4D-STEM Analysis BLOGPOST Battery research Ceramics Compositional analysis Crystallographic Analysis EDX Electron Detectors Material Science Metallurgy Nanomaterials Nanoscale Imaging Orientation maps Phase Analysis Polycrystalline materials Precession Precession-assisted 4D-STEM STEM STEM Instrumentation STEM TECHNOLOGY Scanning Transmission Electron Microscopy Semiconductor Industry Semiconductors Specimen Thickness Strain Mapping Strain analysis Tescan Tensor STEM Thermoelectric Ceramics electron diffraction microscopy automation semiconductor devices strain measurement

Filter all posts by date

OLDEST TO NEWEST NEWEST TO OLDEST
Sign up to receive the latest posts
Materials Science Electron Detectors Semiconductor Industry Nanoscale Imaging Scanning Transmission Electron Microscopy 4D-STEM Analysis Specimen Thickness STEM Instrumentation

Thickness Limitations for STEM Imaging and 4D-STEM Analysis

Optimizing Sample Thickness for STEM Imaging and 4D STEM Analysis

Our latest technical note explores the capabilities of modern STEM instruments to image and analyze thicker specimens. Join us as we uncover the impact of specimen thickness on the...

read more...

Questions?


Want a virtual demo?


Our global team is available to answer questions about TESCAN TENSOR and other solutions from TESCAN.