Our latest technical note explores the capabilities of modern STEM instruments to image and analyze thicker specimens. Join us as we uncover the impact of specimen thickness on the quality of data collected at 100 kV when sensitive direct electron detectors are used and diffraction data enhanced by beam precession.
Key Highlights:
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Gain insights into the capabilities of modern STEM instruments for imaging and analysis.
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Understand the impact of specimen thickness on data quality and analysis outcomes.
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Discover the role of direct electron detectors and beam precession in enhancing analytical STEM capabilities.
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Validate the quality of acquired data with results from benchmark samples used in materials science research and the semiconductor industry.
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Learn why thick specimens of dense materials are essential for studying multi-phase functional materials, such as porous battery electrodes and stacked semiconductor devices, which require lamella integrity that thin specimens cannot provide.
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