Introduction of an Integrated, Precession-Assisted, Analytical 4D-STEM
This webinar will introduce TESCAN TENSOR, the world’s first integrated, precession-assisted, analytical 4D-STEM.
We will have a look at the field of applications it serves, the performance attributes from a 4D-STEM designed from the ground up, and its novel approach to the STEM User Experience resulting from combined systems automation and TEM user expertise.
Presenter
Robert Stroud has degrees in Mechanical Engineering and Materials Science and Engineering. He comes to TESCAN USA from NanoMEGAS USA where he was responsible for sales and marketing of NanoMEGAS products in North and South America and on OEM sales of AppFive products. Prior to his time at NanoMEGAS, he served in a variety of positions from product development to sales and management for several companies including FEI and Cameca.
Advanced materials characterisation with precession-assisted analytical 4D-STEM
This webinar will provide several examples of analytical microscopy performed on the TESCAN TENSOR, showing how you can leverage fast electron beam precession, a fully integrated direct electron detector, large solid-angle EDX detectors, and automated data processing to efficiently characterise complex materials.
Presenter
Rob Hooley is a TEM R&D applications engineer at TESCAN Brno. He joined TESCAN in early 2020 after finishing his PhD in low-dose STEM characterisation of radiation-sensitive nanomaterials at the University of Leeds (UK).
New standards for analytical 4D-STEM performance
This webinar will present the key technical concepts of a modern 4D-STEM instrument, the integration of analytical capabilities, and the synchronization of components in the electron optical system, to unlock the full potential of a 4D-STEM designed from the ground up. We will discuss the key integrated components of the system, the design decisions we made, and how this has affected STEM, 4D-STEM, and Tomography analysis speed, quality of data, and usability.
Presenter
Petr Mareš is the Product Manager of TESCAN TENSOR. He has a background in engineering physics and surface science from Brno University of Technology (CZ). Petr led the development and integration of the detector components of TESCAN TENSOR.
A novel approach to STEM User Experience
This webinar will provide insights into the usability attributes of TESCAN TENSOR, and how the design of a true novel approach to STEM User Experience was influenced by the many years of the combined expertise of Systems Automation and TEM User Experience in the TESCAN Tempe group, led by JK Weiss. The result is a STEM designed for high-quality results that anyone can produce quickly.
Presenter
Jon Karl (JK) Weiss is the General Manager and Group Leader of the TESCAN Tempe R&D group. He has a long background in TEM automation and software development that goes back to the 90s when he was at Emispec and later AppFive, now TESCAN Tempe. During these years, he has also accumulated expert application knowledge about (S)TEM analysis techniques such as precession electron diffraction, and 4D-STEM measurements such as Strain, and EELS.
