Ready to dive into the world of Materials Science and UHR SEMs?
Reveal maximum detail and contrast information from any sample—even magnetic and beam sensitive materials. Newly enhanced TESCAN CLARA features a streamlined user experience that lets you overcome obstacles to productivity and accelerates time to data. And this versatile UHR SEM provides unmatched contrast capabilities that will deliver comprehensive and accurate data to satisfy the widest range of materials research requirements.
At the core of TESCAN CLARA lies our “by researchers for research” design principle. This is reflected in the system's open-access architecture and hardware-configurable platform, allowing users to tailor CLARA to their information needs and achieve the highest level of multimodal characterization performance.
Discover the power that TESCAN CLARA puts at your fingertips to see how it will advance your research.
Characterize Any Material with Confidence
Reveal unprecedented detail
Analysis of morphology, composition and structure is fast and easy for any sample using our BrightBeam™ field-free UHR technology. Ultra-high-resolution imaging performance is suitable for metallic, magnetic, non-conductive, charging, and beam-sensitive specimens, providing accurate analysis—even at low keV—and high surface sensitivity at the nanoscale.
DISCOVER HIDDEN CONTRASTAND FEATURES
Advanced phase contrast imaging with enhanced
surface sensitivity improves visibility for locating
downhole features and enables display of material contrast, topography or both in a single image. TESCAN CLARA’s in-column detection system utilizes a unique design featuring both our Multidetector for collecting electrons according to take-off angle and energy, and our Axial detector for high efficiency SE signal collection at any landing voltage.
Access a Wealth of Data
TAKE ADVANTAGE OF
Apply other characterization techniques correlatively in single system for complex multimodal analysis without risk of exposing your sensitive samples, such as battery materials. Equip CLARA with TESCAN RISE RAMAN for acquisition and analysis of RAMAN spectrum and maps correlated with micron precision to your SEM contrast images. Or add Serial Block Face Imaging (SBFI) for large volume structural analysis of soft materials, polymers and similar materials.
Observe real-time structural and compositional changes, and grain orientation development during dynamic experiments. TESCAN's integrated Tensile Stage solution supports imaging and
analysis of a material’s morphology during stress strain testing. High- resolution digital image correlation (HRDIC) during sample loading
provides a valuable dataset for time-resolved insight into material micromechanics.
OPEN ACCESS ARCHITECTURE
Enjoy the freedom to develop your own experiments. Our platform is designed with an open architecture that allows users to customize analytical routines. One tool available is our imaging automation feature Essence™, which enables fully automated panorama stitching or automated imaging at different user-defined points of interest. For even greater customization of imaging routines, users can utilize Python scripting to program routine tasks with the SharkSEM interface.
Accessible and User-Friendly for Everyone
Empower all users, whether novice, advanced or expert, to achieve the best imaging and analysis results with Essence™, which features guided and customizable workflows, and task-focused automation. Our software platform simplifies microscope control like never before, making SEM operation more intuitive and productive. With a user-friendly interface and streamlined features, operators of all skill levels can easily access and utilize all microscope's capabilities.
START COLLECTING DATA
IN NO TIME
Enhanced productivity begins as soon as you sit behind the instrument. TESCAN CLARA is equipped with an advanced In-Flight™ automation engine that delivers almost instantaneous beam optimization and alignment. With new-generation features such as automated centering, focusing, and continual contrast brightness adjustment, high-resolution images and analytical data can be obtained faster than ever.
SAFETY FOR SAMPLES
Move samples confidently and avoid collisions with in-chamber hardware. The Essence™ replicates the size and geometry of samples and detectors inside the chamber, adding an extra
layer of security during SEM operations. With this model constantly active, the risk of hardware collision is greatly reduced during sample manipulation, stage movement, and detector insertion.
Need more information?
Our global team is available to answer questions about TESCAN SEMs and other solutions from TESCAN.