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Electron Microscopy TESCAN TENSOR zone axis alignment STEM imaging diffraction pattern automated alignments piezo stage TEM instruments Eucentric height microscopy automation STEM diffraction

TESCAN TENSOR: Fully Automated Zone Axis Alignment

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Semiconductors 4D-STEM Electron Microscopy Material characterization Phase mapping Polycrystalline materials Ceramics EDX Metallurgy

TENSOR | Unveiling the Nano-World with Precision and Clarity 

TESCAN GROUP proudly presents a breakthrough in nanoscale analysis: the integration of precession-assisted 4D-STEM phase and orientation mapping with synchronized EDX signals on our TESCAN TENSOR. This innovative approach, spearheaded by our experts,...

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