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Latest Developments in STEM: Trends and Technologies

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Electron Microscopy TESCAN TENSOR microscopy automation STEM

Automated Zone Axis Alignment with TESCAN STEM Insights

REVOLUTIONIZING ZONE AXIS ALIGNMENT WITH FULLY AUTOMATED SYSTEMS

TESCAN TENSOR enhances sample alignment in electron microscopy with its fully automated process. Utilizing a piezo stage for precise movement in all directions (x, y, z), it ensures...

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Semiconductors 4D-STEM Electron Microscopy Material characterization Phase mapping Polycrystalline materials Ceramics EDX Metallurgy

Precession-Assisted 4D-STEM Mapping Insights

Presenting the Nano-World with Precision and Clarity

TESCAN GROUP proudly presents a breakthrough in nanoscale analysis: the integration of precession-assisted 4D-STEM phase and orientation mapping with synchronized EDX signals on our TESCAN TENSOR....

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