Enabling the Full Potential of TESCAN TENSOR for 4D STEM Analysis
TESCAN TENSOR, a multimodal analytical 4D-STEM microscope, enables detailed analysis of micro- and nano-scale domains in heterogeneous materials. It combines electron diffraction tomography (3DED) and electron diffraction mapping (4D-STEM) to determine structures of polycrystalline phases and grain orientations.
This study demonstrates its use in analyzing stannite and enargite phase distribution in copper-rich sulfide ceramics, improving our understanding of the structural basis for their electron-transport properties.
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Advanced Material Analysis with TESCAN TENSOR in 4D STEM
Who Benefits from This Research?
Materials Scientists and Engineers: Gain detailed insights into the structure and distribution of micro- and nano-scale domains within engineered heterogeneous materials.
Energy Researchers: Obtain valuable information on the development of new and advanced materials for clean and renewable energy generation, storage, and efficient use.
Thermoelectric Materials Developers: Gain a structural understanding of the improved efficiency of traditional power generation methods by converting waste heat into electricity.
Nanotechnology Researchers: Utilize the TESCAN TENSOR system for rapid, automated 2D and 3D structural characterization using a single sample lamella.
Industrial Applications: Apply insights from this research to develop scalable production methods for efficient thermoelectric materials
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