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Unlock the Potential of TESCAN TENSOR: 4D-STEM Microscopy Combined with 3D ED Tomography for Advanced Material Analysis

TESCAN TENSOR, a multimodal analytical 4D-STEM microscope, enables detailed analysis of micro- and nano-scale domains in heterogeneous materials. It combines electron diffraction tomography (3DED) and electron diffraction mapping (4D-STEM) to determine structures of polycrystalline phases and grain orientations.

This study demonstrates its use in analyzing stannite and enargite phase distribution in copper-rich sulfide ceramics, improving our understanding of the structural basis for their electron-transport properties.

 

Click below to download the PDF and dive into the future of thermoelectric material analysis.

 

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Who Benefits from This Research?

Materials Scientists and Engineers: Gain detailed insights into the structure and distribution of micro- and nano-scale domains within engineered heterogeneous materials.

Energy Researchers: Obtain valuable information on the development of new and advanced materials for clean and renewable energy generation, storage, and efficient use.

Thermoelectric Materials Developers: Gain a structural understanding of the improved efficiency of traditional power generation methods by converting waste heat into electricity.

Nanotechnology Researchers: Utilize the TESCAN TENSOR system for rapid, automated 2D and 3D structural characterization using a single sample lamella.

Industrial Applications: Apply insights from this research to develop scalable production methods for efficient thermoelectric materials

 

Thank you for your interest.

 

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