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FIB-SEM as a Game-Changer for Atom Probe Tomography
Dr. Kathrin Rudolph of TESCAN showcased the company’s approach to addressing challenges in life science research through flexible microscopy solutions.
Lucille A. Giannuzzi from TESCAN Group presented TESCAN’s latest innovations in hardware, software, and automated workflows for preparing electron-transparent specimens for S/TEM analysis.
