TESCAN Aura Gentle Ion Beam, empowered by Technoorg Linda technology, introduces a transformative approach to TEM specimen preparation. Advanced integration of Technoorg Linda’s gentle ion beam technology is designed to work flawlessly with TESCAN’s FIB-SEMs and provides high level of quality control during the preparation. The systems with integrated AURA Gentle Ion Beam enable researchers to produce top-tier TEM specimens with unmatched ease and accuracy.
Redefine TEM sample preparation
Navigating the complexities of TEM sample preparation for high-resolution (S)TEM has never been more straightforward. The integrated gentle ion beam in TESCAN’s FIB-SEM simplifies the complex process of TEM specimen preparation, addressing the intrinsic challenges of multi-phased materials and their susceptibility to Ga+ FIB beams.
With TESCAN Aura Gentle Ion Beam, empowered by Technoorg Linda technology, you can ensure optimal thickness and minimal amorphization damage, essential for clear and precise TEM imaging. The system operates at argon ion energies down to 200 eV and below, which minimizes damage and preserves the crystalline structure of samples.
Key Benefits of the TESCAN Aura Gentle Ion Beam System
Ultra-Thin
Specimens
Efficiency and Protection
Streamlined
Workflow
High-Resolution
TEM Imaging
Advanced Features and Integration
The system leverages AI Machine Learning to identify crucial physical features like the nanomanipulator tip, alignment marks, and lamella edges. TESCAN’s proprietary OptiLift™ nanomanipulator, mounted below the FIB column, provides a high degree of freedom to mount lamellae in favorable geometries, addressing challenges like curtaining.
