FIB-SEMs: A Critical Tool for Precision in Atom Probe Tomography (APT)
FIB-SEM as a Game-Changer for Atom Probe Tomography
Webinar Description
On December 3rd, 2024, TESCAN Group brought together materials researchers and microscopy experts for a deep dive into how TESCAN’s FIB-SEM solutions elevate the quality and precision of Atom Probe Tomography (APT) specimen preparation.
Hosted in collaboration with Cameca Instruments, this webinar shed light on advanced approaches that reduce sample damage and deliver reproducible, site-specific results - - crucial factors when analyzing materials at the atomic scale.
Speakers Petr Klímek (TESCAN) and Dr. Katherine Rice (Cameca) guided attendees through the latest techniques and technologies, demonstrating how careful preparation methods transform complex materials into pristine specimens ready for APT.
Key Highlights:
- Precision in APT Prep: Insights into using FIB-SEM for producing minimally damaged, orientation-specific tips, ensuring that even challenging, non-conductive, or heterogeneous materials are set up for optimal APT characterization.
- Advances in Cryo Preparation: Techniques for managing samples susceptible to environmental factors, showing how cryogenic workflows preserve structural integrity before APT analysis.
- Next-Generation Platforms: The TESCAN AMBER X 2 and AMBER 2 platforms enable controlled surface refinement and gentle, clean polishing—essential for safeguarding sensitive materials and ensuring optimal APT results.
- Enhanced Efficiency & Automation: Tools like TESCAN OptiLift™ facilitate precise manipulation and transfer of samples, while FIB-SEM Expert PI and Visual Coder scripting streamline complex routines, improving reproducibility and accelerating research.
Meet the Experts:
With close to a decade of experience bridging academia and industry, Petr Klímek of TESCAN Group leverages his Fulbright-supported research background and product development insights to implement cutting-edge SEM and FIB-SEM solutions that address real-world materials science challenges.
Combining a PhD in Chemical Engineering with experience at NIST, Dr. Katherine Rice’s expertise spans transmission EBSD, nanoparticle synthesis, and atom probe tomography. Her practical perspective ensures that even the most advanced analytical approaches remain grounded in achievable, laboratory-ready techniques.
Questions?
Want a virtual demo?
Our global team is available to answer questions about TESCAN FIB-SEMs and other solutions from TESCAN.