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Pioneering Perspectives in Material Sciences

TESCAN Insights

Explore the FIB-SEM technologies and their practical applications within material sciences through our expert insights.

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Revealing the Invisible — High-Quality Cross-Sectional Imaging with TESCAN’s OptiGIS O₂ Module

Booth C11 | 30 June–4 July | Suntec Singapore Convention & Exhibition Centre

Unlock a New Level of Performance in Carbon-Based and Sensitive Materials

Enhance the clarity and precision of your high-resolution (S)TEM investigations with the integrated Gentle Ion Beam™ system.

TESCAN Group is proud to participate once again in the 13th Asia Pacific Microscopy Congress (APMC13) held in Brisbane from February 2-7, 2025. Our team will be at booth #1, ready to demonstrate our latest advancements in microscopy technology that...

Brno, Czech Republic (November 25, 2024)TESCAN Group, a.s, a leading global manufacturer of electron microscopes and advanced scientific instruments, has acquired EXpressLO LLC, a provider of innovative FIB lift-out solutions for specimen preparation...

BRNO - TESCAN GROUP, a global leader in electron microscopy and scientific instrumentation, is proud to announce the establishment of its newest subsidiaries, TESCAN Taiwan and TESCAN Singapore, as part of its strategic expansion in the Asia-Pacific...

Join our upcoming webinar to explore how TESCAN’s Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) technology enhances Atom Probe Tomography (APT) specimen preparation. 

 A Non-programmers’ guide to FIB-SEM automation

Are you eager to enhance your microscopy workflows but feel overwhelmed by programming jargon? TESCAN’s upcoming webinar, “Non-programmers’ guide to FIB-SEM automation,” is crafted for professionals of all...

From the Vastness of Space to Atomic Precision

In a new study, scientists have leveraged TESCAN’s state-of-the-art microscopy technology to peer into the minute details of asteroid 162173 Ryugu. This collaborative effort, involving researchers from...

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