Webinar Description
Recap: Advances in Specimen Preparation Workflows for S/TEM Analysis
Lucille A. Giannuzzi from TESCAN Group presented TESCAN’s latest innovations in hardware, software, and automated workflows for preparing electron-transparent specimens for S/TEM analysis.
The seminar highlighted TESCAN’s BrightBeam™ SEM column, providing ultra-high-resolution (UHR) imaging with BSE energy-filtering, and the TEM AutoPrep™ Pro software for fully automated specimen preparation on both Ga+ and Xe+ ion FIB platforms.
The software uses machine learning for precise in situ lift-out (INLO) and mounting. Additionally, TESCAN’s AURA Gentle Ion Beam™ was introduced for enhanced specimen quality via low-energy Ar+ ion milling. The MISTRAL™ plasma FIB column demonstrated industry-leading 10 nm resolution, with improved current densities and beam stability.
Session highlights:
Automated TEM Specimen Preparation: TEM AutoPrep™ Pro offers a fully automated process for both ex situ and in situ lift-outs, integrating machine learning for high-precision probe attachments.
Advanced SEM Imaging with BrightBeam™: The 3rd generation column supports UHR imaging with an in-column BSE detector and a booster column, tailored for the AMBER 2 and AMBER X2 FIB/SEM platforms.
Enhanced Plasma FIB Resolution: The MISTRAL™ column achieves industry-leading resolution of 10 nm, optimized for high-quality prototyping and S/TEM specimen preparation.
Meet the Speaker
Dr. Lucille A. Giannuzzi joined TESCAN USA as the Regional Sales Manager for the Mid-Atlantic region in 2019. With extensive expertise in focused ion beam, scanning electron, and transmission electron microscopy, Dr. Giannuzzi brings applications knowledge that spans both physical and life sciences.