Webinar Description
In this session, Daniel Němeček from TESCAN GROUP presented an innovative approach to material analysis using the TESCAN TENSOR microscope’s precession-assisted electron diffraction, designed to make nanoscale structural analysis more efficient and user-friendly.
Button: Access the full seminar recording here!
This session covered how the TESCAN TENSOR overcomes limitations of traditional TEM microscopes, which were not optimized for analytical STEM applications.
With a STEM-focused design and integrated state-of-the-art components - including a large direct electron detector, electron beam precession, and dual EDS detectors - the TESCAN TENSOR achieves seamless multi-modal data acquisition, ultra-high vacuum conditions, and improved measurement throughput.
Session highlights:
Interactive Real-Time Analysis: The microscope’s single interface enables on-the-fly data processing and visualization, transforming sample analysis into an interactive experience and eliminating the need for separate TEM imaging modes.
Enhanced User Experience: Automated system alignments and simplified STEM and 4D-STEM settings streamline workflows, offering a user experience similar to SEM and FIB/SEM instruments.
Precision and Data Quality: Fully integrated beam precession enhances the accuracy of 4D-STEM and 3D-ED structural information.
Meet the Speaker
Dr. Daniel Němeček is aProduct Marketing Manager for the TESCAN TENSOR. With a PhD in Biophysics, Daniel has over 20 years of experience in spectroscopy and microscopy, having served as a research scientist and head of electron microscopy facilities in both academia and industry.