Webinar Description
In this seminar, Dr. Joaquim Portillo from NanoMEGAS shared insights into the latest advancements in Scanned Precession Electron Diffraction (SPED) technology.
Access the full seminar recording here!
Dr. Portillo explored the breakthroughs in electrical field mapping of semiconductor junctions and the structural analysis of beam-sensitive protein crystals. He emphasized the challenges associated with protein observation at room temperature using electron microscopy, a deviation from the established cryo-preparation techniques.
Key points discussed:
- SPED for Electrical Field Mapping: Dr. Portillo shared how SPED is used to map electrical fields in semiconductor junctions.
- Protein Crystallography in Liquid: He also discussed advancements in the structural analysis of beam-sensitive proteins encapsulated in liquid, using lysozyme as a case study.
- Challenges at Room Temperature: The seminar addressed the difficulties of protein handling and observation at room temperature, compared to cryo-methods.
Meet the Speaker
Dr. Joaquim Portillo, a leader in electron diffraction and crystallography, brings extensive experience in using cutting-edge microscopy techniques for both materials and biological studies. He is a key contributor to the SPED developments at NanoMEGAS.