Join our launch webinar and explore oxygen gas-assisted FIB-SEM milling
Key Highlights:
1. Boost your productivity in carbon-based materials by accelerating milling and minimizing carbon redeposition.
2. Reduce contamination of your samples
Meet the Hosts:
Milos Hrabovsky (TESCAN) specializes in electron and ion beam patterning, advanced deposition and etching techniques, and microscope automation through scripting. With a strong background as an R&D Application Specialist in electron beam lithography and focused ion beam patterning, Milos brings extensive expertise in electron and ion beam microscopy for nanofabrication.
Jamie Ford (University of Pennsylvania) is a leading expert in materials science and electron/ion beam microscopy. He manages the FIB-SEM suite at the Singh Center for Nanotechnology and focuses on advanced characterization techniques involving polymers and metal-organic frameworks.
In his guest talk, he’ll share a real-world application of OptiGIS O2: Imaging MXene sheet orientation inside a polymer nanocomposite - highlighting how oxygen-assisted milling improves contrast and surface quality in complex materials.
Date & Time
- April 29th, 2025, at 9:00 AM CET (3:00 AM EST / 4:00 PM CST)
- April 29th, 2025, at 5:00 PM CET (11:00 AM EST / 12:00 AM CST)
Be among the first to explore how OptiGIS O2 helps you gain precision, speed, and control in FIB-SEM analysis!