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FIB-SEM as a Game-Changer for Atom Probe Tomography

Dr. Kathrin Rudolph of TESCAN showcased the company’s approach to addressing challenges in life science research through flexible microscopy solutions.

Lucille A. Giannuzzi from TESCAN Group presented TESCAN’s latest innovations in hardware, software, and automated workflows for preparing electron-transparent specimens for S/TEM analysis.

Re-watch our webinar, “Non-programmers’ guide to FIB-SEM automation,” and learn how to streamline your microscopy workflows with ease, using TESCAN’s SEM/FIB-SEM Expert PI software.

Join TESCAN for an engaging webinar that highlights the advanced capabilities of the TESCAN AMBER 2 in precision nanoprototyping.

Questions?
Want a virtual demo?

Our global team is available to answer questions about TESCAN FIB-SEMs and other solutions from TESCAN.