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FIB-SEM as a Game-Changer for Atom Probe Tomography

Dr. Kathrin Rudolph of TESCAN showcased the company’s approach to addressing challenges in life science research through flexible microscopy solutions.

Lucille A. Giannuzzi from TESCAN Group presented TESCAN’s latest innovations in hardware, software, and automated workflows for preparing electron-transparent specimens for S/TEM analysis.

In this session, Daniel Němeček from TESCAN GROUP presented an innovative approach to material analysis using the TESCAN TENSOR microscope’s precession-assisted electron diffraction, designed to make nanoscale structural analysis more efficient and user-friendly.

In this seminar, Dr. Gregory B. Thompson from The University of Alabama delved into the benefits of correlative Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT) for studying structure-chemical relationships in nanocrystalline metals.

In this seminar, Dr. Joaquim Portillo from NanoMEGAS shared insights into the latest advancements in Scanned Precession Electron Diffraction (SPED) technology.

Re-watch our webinar, “Non-programmers’ guide to FIB-SEM automation,” and learn how to streamline your microscopy workflows with ease, using TESCAN’s SEM/FIB-SEM Expert PI software.

Join TESCAN for an engaging webinar that highlights the advanced capabilities of the TESCAN AMBER 2 in precision nanoprototyping.

Join TESCAN for an insightful webinar that explores the latest advancements in TEM lamella preparation with the TESCAN AMBER 2 and TESCAN AMBER X2 systems.

Join TESCAN for an in-depth webinar showcasing the groundbreaking advancements in 3D multimodal characterization with the TESCAN AMBER X2

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