Filter all posts by date
FIB-SEM as a Game-Changer for Atom Probe Tomography
Dec 13, 2024 8:04:40 AM
Dr. Kathrin Rudolph of TESCAN showcased the company’s approach to addressing challenges in life science research through flexible microscopy solutions.
Dec 6, 2024 11:21:47 AM
Lucille A. Giannuzzi from TESCAN Group presented TESCAN’s latest innovations in hardware, software, and automated workflows for preparing electron-transparent specimens for S/TEM analysis.
Nov 20, 2024 2:12:18 PM
In this session, Daniel Němeček from TESCAN GROUP presented an innovative approach to material analysis using the TESCAN TENSOR microscope’s precession-assisted electron diffraction, designed to make nanoscale structural analysis more efficient and user-friendly.
Nov 19, 2024 1:29:42 PM
In this seminar, Dr. Gregory B. Thompson from The University of Alabama delved into the benefits of correlative Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT) for studying structure-chemical relationships in nanocrystalline metals.
Nov 8, 2024 7:46:29 PM
In this seminar, Dr. Joaquim Portillo from NanoMEGAS shared insights into the latest advancements in Scanned Precession Electron Diffraction (SPED) technology.
Nov 8, 2024 7:42:00 PM
Re-watch our webinar, “Non-programmers’ guide to FIB-SEM automation,” and learn how to streamline your microscopy workflows with ease, using TESCAN’s SEM/FIB-SEM Expert PI software.
Oct 14, 2024 10:06:56 AM
Join TESCAN for an engaging webinar that highlights the advanced capabilities of the TESCAN AMBER 2 in precision nanoprototyping.
Sep 5, 2024 9:00:00 AM
Join TESCAN for an insightful webinar that explores the latest advancements in TEM lamella preparation with the TESCAN AMBER 2 and TESCAN AMBER X2 systems.
Sep 3, 2024 9:00:00 AM
Join TESCAN for an in-depth webinar showcasing the groundbreaking advancements in 3D multimodal characterization with the TESCAN AMBER X2
Aug 23, 2024 11:47:16 AM
No results found
Our global team is available to answer questions about TESCAN FIB-SEMs and other solutions from TESCAN.