Join University of Sydney and TESCAN to explore how plasma FIB-SEM is evolving — from a tool for large-scale 3D characterization to a universal solution that also delivers precise, reproducible TEM specimen preparation.
Plasma FIB-SEM systems have traditionally been associated with high-throughput volume characterization. However, the demands of modern materials research require more — precise, damage-minimized TEM sample preparation with high reproducibility.
In this webinar, TESCAN and the University of Sydney will present how the AMBER X 2, with Mistral™ plasma FIB technology, is redefining expectations.
You’ll see how plasma FIB-SEM can now meet both high-volume 3D characterization needs and deliver high-precision lamellae for advanced TEM applications — in one universal system.
Speakers:
Felix Theska (Uni Sydney), a Senior Technical Officer at Sydney Microscopy & Microanalysis, University of Sydney. Felix Theska is supporting researchers in the specimen preparation for atom probe tomography and transmission electron microscopy. In his career, he employed FIB-SEM tools equipped with Ga+, Xe+, and Ar+ columns as well as analytical capabilities, such as EDXS, EBSD, and TKD for site-specific specimen preparation of phase boundaries, grain boundaries, thin film multi-layer structures and nanoscale particles. Before his role at Sydney Microscopy & Microanalysis, Felix worked as a Postdoctoral Fellow at The University of New South Wales (UNSW) Sydney, and a Research Assistant at the University of Technology Ilmenau in Germany.
Martin Sláma (TESCAN), a Product Marketing Manager for FIB-SEM 3D characterization and TEM lamella preparation in materials science, bringing over eight years of experience with FIB-SEM instruments. Throughout his career utilizing the FIB-SEM technique, he has primarily concentrated on both conventional and advanced TEM preparation methods using TESCAN's plasma FIB and Ga+ FIB-SEM solutions, alongside material characterization through FIB-SEM 3D tomography. Before joining TESCAN, Martin was involved in new material development and characterization at Brno Technological University, CEITEC, and Aston University.
What You’ll Learn:
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How optimized plasma FIB profiles enable artefact-free TEM specimen preparation
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Real-world case studies from The University of Sydney’s workflows
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Why AMBER X 2 is Proven to Lead in performance, precision, and versatility
Reserve your spot and learn what’s next in TEM sample preparation!