Remove bottlenecks in TEM workflows by taking lift-out outside the FIB-SEM and into a dedicated EXLO station
Join Us Live: See EXLO Transform TEM Workflows
Date & Time:
Tuesday, 14 Oct 2025, 7:00 AM (EDT) | 1:00 PM (CEST) | 7:00 PM (CST, Beijing)
Tuesday, 14 Oct 2025, 2:00 PM (EDT) | 8:00 PM (CEST) | 2:00 AM +1 day (CST, Beijing)
What you will learn
- How EXLO decouples lamella manipulation from milling to keep FIB-SEM instruments focused on high value work
- How a single EXLO platform can support multiple FIB-SEMs to increase throughput and reduce cost per specimen
- How EXpressLO slotted grids and Aspirato™ vacuum-assisted transfer tools ensure secure placement and reproducible TEM results
Our hosts are ready to answer your questions
Dr. Lucille A. Giannuzzi, FAVS, FMSA, FMAS
Dr. Giannuzzi is an internationally recognized expert in focused ion beam (FIB) technology and electron microscopy, with decades of experience advancing transmission electron microscopy (TEM) specimen preparation workflows in both academia and industry. She is the inventor of the EXpressLO (EXLO) technology, which has transformed ex situ lift-out techniques and accelerated specimen preparation.
She serves as an Adjunct Professor at SUNY Stony Brook and is a Fellow of the American Vacuum Society (AVS), the Microscopy Society of America (MSA), and the Microanalysis Society (MAS). With over 100 peer-reviewed publications and pioneering contributions to S/TEM specimen preparation, Dr. Giannuzzi continues to shape the field through her innovations, teaching, and leadership in the scientific community.try.
Can’t join live?
No worries. Sign up anyway and we will send you the full recording so you can watch at your convenience.