TESCAN TENSOR
STEM done right
The first near-UHV 4D-STEM
that is Integrated, Precession-Assisted,
and Analytical
TESCAN TENSOR is the world’s first dedicated 4D-STEM
for multimodal characterization of nanoscale morphological, chemical, and structural properties of functional materials, thin films, and synthetic particles, with stand-out 4D-STEM performance and unprecedented usability.
- Synchronization of Scanning with Diffraction Imaging, EDS Acquisition and Beam Blanking.
- Integrated, Near Real-Time 4D-STEM data Analysis and Processing
- Performance benefits from Electron Beam Precession and near-UHV
- A novel approach to STEM User Experience
Analytical 4D-STEM
The full picture of electron beam - specimen interaction
4D-STEM is the microscopy method of choice for true nanoscale, multimodal characterization of material properties such as morphology, chemistry, and structure. At each pixel in the STEM dataset, TESCAN TENSOR acquires a diffraction pattern and an EDS spectrum, fast and perfectly synchronized. Together, diffraction and spectroscopy data encapsulate the full picture of electron beam - specimen interaction, from which a wide range of material properties can be derived.
Real-time Analysis and Processing of 4D-STEM data
A truly unique feature of TESCAN TENSOR is Explore, TENSOR’s integrated platform for real-time processing and analysis of large-scale scanning electron diffraction datasets.
Explore brings 4D-STEM measurements to Material Scientists, Semiconductor Researchers and Failure Analysis, and Crystallographers, without requiring expert knowledge of STEM optics or 4D-STEM data analysis and post-processing.
Advanced users are served with the ability to adjust the preset optimized optical properties for each STEM or 4D-STEM measurement to their preference. Furthermore, 4D-STEM data acquired with the Virtual STEM measurement is compatible with open-source computational platforms such as HyperSpy, LiberTEM or Py4DSTEM, available to advanced users to develop their own 4D-STEM measurements.
Differentiated 4D-STEM Performance
Performance of TESCAN TENSOR’s 4D-STEM capabilities is supported by ultrafast and precise synchronization of scanning with (direct electron) diffraction imaging, EDS acquisition, electron beam precession, beam blanking, and real-time analysis and processing of the acquired data.
This has been made possible by integrating state-of-the-art components and techniques “from the ground up”:
- Hybrid Pixel, Direct Electron Detection (DED)
- Near-Ultra High Vacuum within the sample area (near-UHV)
- Precession Electron Diffraction (PED)
- Fast, integrated Beam Blanking
- Large solid angle, symmetrical, window-less EDS
- Real-time 4D-STEM analysis and processing (Explore)
TESCAN TENSOR: A STEM that is as easy to use as a SEM
Scientists, Engineers, Technicians and Students have long wanted a TEM solution that is readily usable without weeks, or months, of training on non-productive electron-optical adjustments and alignments. TESCAN TENSOR lets you spend your time on the microscope interacting with your sample, instead of the optics. This is achieved by the implementation of “measurements” with preset optical properties such as beam current, convergence angle, spot size and precession ON or OFF, adjusted and aligned automatically.
The result: an analytical 4D-STEM that is as easy to use as TESCAN SEMs, with all the efficiency and economic benefits of a results driven Electron Microscope.
This approach potentially also yields economic benefits, such as better accessibility by novice users, leading to higher tool utilization supporting the return of your investment.
Near Real-time Analysis and Processing of 4D-STEM data
A truly unique feature of TESCAN TENSOR is Explore, TENSOR’s integrated platform for real-time processing and analysis of large-scale scanning electron diffraction datasets.
Explore brings 4D-STEM measurements to Material Scientists, Semiconductor Researchers and Failure Analysis, and Crystallographers, without requiring expert knowledge of STEM optics or 4D-STEM data analysis and post-processing.
Advanced users are served with the ability to adjust the preset optimized optical properties for each STEM or 4D-STEM measurement to their preference. Furthermore, 4D-STEM data acquired with the Virtual STEM measurement is compatible with open-source computational platforms such as HyperSpy, LiberTEM or Py4DSTEM, available to advanced users to develop their own 4D-STEM measurements.
Differentiated 4D-STEM Performance
Performance of TESCAN TENSOR’s 4D-STEM capabilities is supported by ultrafast and precise synchronization of scanning with (direct electron) diffraction imaging, EDS acquisition, electron beam precession, beam blanking, and real-time analysis and processing of the acquired data.
This has been made possible by integrating state-of-the-art components and techniques “from the ground up”:
- Hybrid Pixel, Direct Electron Detection (DED)
- Near-Ultra High Vacuum within the sample area (near-UHV)
- Precession Electron Diffraction (PED)
- Fast, integrated Beam Blanking
- Large solid angle, symmetrical, window-less EDS
- Real-time 4D-STEM analysis and processing (Explore)
TESCAN TENSOR: A STEM that is as easy to use as a SEM
Scientists, Engineers, Technicians and Students have long wanted a TEM solution that is readily usable without weeks, or months, of training on non-productive electron-optical adjustments and alignments. TESCAN TENSOR lets you spend your time on the microscope interacting with your sample, instead of the optics. This is achieved by the implementation of “measurements” with preset optical properties such as beam current, convergence angle, spot size and precession ON or OFF, adjusted and aligned automatically.
The result: an analytical 4D-STEM that is as easy to use as TESCAN SEMs, with all the efficiency and economic benefits of a results driven Electron Microscope.
This approach potentially also yields economic benefits, such as better accessibility by novice users, leading to higher tool utilization supporting the return on investment.
Questions?
Want a virtual demo?
Our global team is available to answer questions about
TESCAN TENSOR and other solutions from TESCAN.