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Explore the FIB-SEM technologies and their practical applications within material sciences through our expert insights.
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TESCAN Group is proud to participate once again in the 13th Asia Pacific Microscopy Congress (APMC13) held in Brisbane from February 2-7, 2025. Our team will be at booth #1, ready to demonstrate our latest advancements in microscopy technology that...
Brno, Czech Republic (November 25, 2024)– TESCAN Group, a.s, a leading global manufacturer of electron microscopes and advanced scientific instruments, has acquired EXpressLO LLC, a provider of innovative FIB lift-out solutions for specimen preparation...
BRNO - TESCAN GROUP, a global leader in electron microscopy and scientific instrumentation, is proud to announce the establishment of its newest subsidiaries, TESCAN Taiwan and TESCAN Singapore, as part of its strategic expansion in the Asia-Pacific...
Join our upcoming webinar to explore how TESCAN’s Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) technology enhances Atom Probe Tomography (APT) specimen preparation.
In a new study, scientists have leveraged TESCAN’s state-of-the-art microscopy technology to peer into the minute details of asteroid 162173 Ryugu. This collaborative effort, involving researchers from...
TESCAN is thrilled to announce a series of four informative webinars exploring the latest advancements in materials analysis technology. These online events, held in collaboration with Wiley Analytical Science (WAS), will showcase the capabilities of our...
TESCAN is proud to announce the launch of our latest innovation in materials analysis technology: the TESCAN AMBER X 2. This cutting-edge plasma FIB-SEM system is poised to set a new standard in materials science research, offering unmatched resolution,...