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Pioneering Perspectives in Material Sciences

TESCAN Insights

Explore the FIB-SEM technologies and their practical applications within material sciences through our expert insights.

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TESCAN AMBER X Flyer

 A Non-programmers’ guide to FIB-SEM automation

Are you eager to enhance your microscopy workflows but feel overwhelmed by programming jargon? TESCAN’s upcoming webinar, “Non-programmers’ guide to FIB-SEM automation,” is crafted for professionals of all...

From the Vastness of Space to Atomic Precision

In a new study, scientists have leveraged TESCAN’s state-of-the-art microscopy technology to peer into the minute details of asteroid 162173 Ryugu. This collaborative effort, involving researchers from...

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