TESCAN Introduces AMBER X 2: Breakthroughs in Materials Science

TESCAN is proud to announce the launch of our latest innovation in materials analysis technology: the TESCAN AMBER X 2.

This cutting-edge plasma FIB-SEM system is poised to set a new standard in materials science research, offering unmatched resolution, throughput, and versatility for comprehensive sample preparation and characterization.

Key Features of AMBER X 2

• Enhanced Plasma FIB Column: The AMBER X 2 optimizes beam parameters for superior profiles, simplifying workflows and improving resolution, navigation, and milling performance.
  

• Field-Free SEM Column: This feature allows high-resolution imaging of diverse materials, eliminating the limitations of immersion optics with a wide field of view and various scanning modes.
  

• Multimodal and Multiscale Analysis: AMBER X 2 supports unique 3D methods like real-time 3D ToF-SIMS for detailed elemental composition analysis, crucial for next-generation battery research.

Launch Webinars and Events

To showcase the capabilities of the AMBER X 2, TESCAN is hosting a series of informative webinars in collaboration with Wiley Analytical Science. These online events will provide a comprehensive overview of how TESCAN AMBER X 2 can enhance your research and development workflows.

August 20^th, 2024

Introducing AMBER X 2 and AMBER 2: New Generation FIB-SEMs for Speed, Utility, Precision

Witness TESCAN’s innovation with the introduction of AMBER X 2 and AMBER 2. This webinar covers:

• A Decade of FIB-SEM Innovation: TESCAN’s journey in FIB-SEM development.
  

• The Power of Mistral™ Plasma FIB: How AMBER X 2 bridges the gap between precision and throughput.
  

• Real-World Applications: Versatility and efficiency of AMBER X 2 and AMBER 2 in various research applications.

Host: Martin Sláma, Product Marketing Manager at TESCAN, with over 8 years of experience in FIB-SEM 3D characterization and TEM lamella preparation for materials science.

This webinar is part of a cooperation with Wiley Analytical Science. Find all the details and a link to the registration at their website.

______________________________________________________________________

August 22^nd, 2024
FIB-SEM, Redefined. Experience Speed, Precision, and Utility in 3D Multimodal Characterization with AMBER X 2

Master the art of 3D multimodal characterization with the TESCAN AMBER X 2 Plasma FIB-SEM. This webinar explores:

• Speed & Precision: How AMBER X 2 balances data quality and volume.
  

• Optimizing FIB-SEM Tomography: Strategies for faster analysis with minimal artifacts.
  

• Real-World Applications: Uses of AMBER X 2 in studying various materials.

Host: Tomáš Šamořil, Product Marketing Manager at TESCAN, with a doctoral background in Physical and Materials Engineering and rich experience as an Application Specialist.

This webinar is part of a cooperation with Wiley Analytical Science. Find all the details and a link to the registration at their website.

______________________________________________________________________

September 3^rd, 2024
New Generation of TESCAN TEM Lamella Automation TEM AutoPrep Pro™: Enhance Speed and Utility in Specimen Preparation with AMBER 2 and AMBER X 2

Explore the future of TEM sample preparation with TESCAN's AMBER 2 and AMBER X 2 systems. This webinar focuses on:

• High-Throughput TEM Prep: How AMBER 2 and AMBER X 2 meet high-throughput, consistent sample preparation needs.
  

• Automated Workflows: The TEM AutoPrep Pro™ with AMBER X 2.
  

• Precise Lamella Geometries: Capabilities of the OptiLift™ nanomanipulator in AMBER X 2.

Host: Martin Sláma, Product Marketing Manager at TESCAN, with over 8 years of experience in FIB-SEM 3D characterization and TEM lamella preparation for materials science.

This webinar is part of a cooperation with Wiley Analytical Science. Find all the details and a link to the registration at their website.

______________________________________________________________________

September 5^th, 2024
Utility and Precision in Nanoprototyping with TESCAN AMBER 2: Your Gateway to Rapid Development of Novel Devices

Unleash the potential of rapid device development with the TESCAN AMBER 2. This webinar dives into:

• Streamlined Workflows: How AMBER 2’s design minimizes downtime and maximizes efficiency.
  

• Versatile Sample Preparation: AMBER 2’s capabilities for various nanoprototyping tasks.
  

• Comprehensive Analysis: Insights into AMBER 2’s UHR imaging capabilities.

Host: Milos Hrabovsky, Product Marketing Manager for Nanoprototyping at TESCAN, specializing in electron and ion beam patterning, depositions, enhanced etching, and microscope automation through scripting.

This webinar is part of a cooperation with Wiley Analytical Science. Find all the details and a link to the registration at their website.

______________________________________________________________________

Join Us at the Official Launch Event

The official launch event for TESCAN AMBER X 2 will take place during the EMC conference in Copenhagen on August 25th at the TESCAN booth (No. B9). We invite all attendees to join us, meet the developers, and explore the full capabilities of TESCAN AMBER X 2. Don’t forget to book your demo here.

After the event, the new AMBER X 2 will be available for demonstrations in our labs in Warendale (US) and Brno (CZ), so do not miss your chance to ask our representatives for a demonstration.