Webinar Announcement: Enhancing Atom Probe Tomography – Precision Preparation with TESCAN FIB-SEM

Join our upcoming webinar to explore how TESCAN’s Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) technology enhances Atom Probe Tomography (APT) specimen preparation.  

For scientists and researchers focused on atomic-scale materials analysis, mastering the intricacies of APT specimen preparation is essential. In this online session in cooperation with Cameca Instruments, you’ll learn how TESCAN’s FIB-SEM systems enable precise preparation with minimal sample damage, essential for achieving accurate and reliable results in APT analysis. 

Webinar Title: FIB-SEMs: A Critical Tool for Precision in Atom Probe Tomography (APT) 

Date & Time: December 3rd, 2024, | 9am or 5pm CEST 

Registration: Registration was closed

The Role of FIB-SEM in Atom Probe Tomography  

APT enables atomic-level material analysis, but its success hinges on the precision of specimen preparation. Other alternative methods often fall short when preparing samples from heterogeneous, non-conductive, or environmentally sensitive materials. FIB-SEM, by contrast, provides high-resolution imaging and site-specific ion milling, addressing the need for minimal sample damage and optimal orientation. 

In this webinar, attendees will learn about techniques for effective APT specimen preparation with TESCAN FIB-SEM systems. Topics will include insights into Cryo sample preparation for handling environmentally sensitive materials, the benefits of TESCAN’s new Mistral™ Plasma FIB and Aura Gentle Ion Beam features, and the role of advanced automation in achieving reproducibility. 

Why Attend? 

In this webinar, Petr Klímek, Product Marketing Director at TESCAN, and Dr. Katherine Rice, Applications Manager at Cameca Instruments, will outline how TESCAN’s FIB-SEM solutions, including the AMBER X 2 and AMBER 2 platforms, address APT preparation challenges with scientific precision.  

They will highlight newly launched features designed to enhance sample integrity and workflow efficiency, including: 

• TESCAN AMBER X 2 Platform: This versatile system integrates customizable workflows and low-energy ion cleaning (down to 500 eV) with inert Xe ions, ensuring high-quality sample integrity for a range of materials. 
   

• TESCAN AMBER 2 Platform: Equipped with the AURATM Gentle Ion Beam, AMBER 2 provides delicate polishing within a clean, high-vacuum environment, ideal for sensitive specimens. 
   

• Advanced Manipulation and Automation: Tools like TESCAN OptiLift™ enable orientation-specific manipulation, while FIB-SEM Expert PI and Visual Coder scripting support automation and reproducibility, making complex workflows more accessible and consistent. 

Meet the Experts 

With nearly a decade in SEM and FIB-SEM, Petr Klímek combines academic and industry experience, including Fulbright-supported research in micromechanics and product initiatives at TESCAN, advancing materials science with practical insights. 

Dr. Katherine Rice, Applications Manager at Cameca Instruments, brings hands-on expertise in materials characterization, backed by a PhD in Chemical Engineering and an NRC postdoc at NIST. Her work spans transmission EBSD, nanoparticle synthesis, and atom probe tomography. 

Reserve Your Spot 

Don’t miss this opportunity to gain insights into APT specimen preparation from a leading expert. Sign up today to deepen your understanding of how TESCAN’s FIB-SEM solutions can support your research.