We have some exciting news from the world of scientific instrumentation. The launch of the next generation of our highly acclaimed AMBER platform is imminent: TESCAN AMBER 2, the fourth generation of the TESCAN gallium FIB-SEM platform and the successor to the current AMBER generation, will be unveiled at this year’s at the Microscopy & Microanalysis (M&M) Expo 2024.
Alongside AMBER 2, TESCAN is also unveiling two new integrated innovative tools: AURA Gentle Ion Beam system, for minimizing gallium FIB induced damage in TEM specimen preparation, and TEM AutoPrep ProTM software, for automating and optimizing the entire TEM sample preparation process.
Introducing AMBER 2: Perfecting TEM/STEM Sample Preparation and Nanoprototyping AMBER 2 debuts at M&M 2024 with New Tools for TEM Sample Preparation
We have some exciting news from the world of scientific instrumentation. The launch of the next generation of our highly acclaimed AMBER platform is imminent: TESCAN AMBER 2, the fourth generation of the TESCAN gallium FIB-SEM platform and the successor to the current AMBER generation, will be unveiled at this year’s at the Microscopy & Microanalysis (M&M) Expo 2024.
Alongside AMBER 2, TESCAN is also unveiling two new integrated innovative tools: AURA Gentle Ion Beam system, for minimizing gallium FIB induced damage in TEM specimen preparation, and TEM AutoPrep ProTM software, for automating and optimizing the entire TEM sample preparation process.
Introducing AMBER 2: Perfecting TEM/STEM Sample Preparation and Nanoprototyping
The original TESCAN AMBER, introduced in 2019, set new standards in materials nanocharacterization with its ultra-high-resolution SEM and advanced Ga+ FIB.
AMBER 2 builds on this legacy with enhanced automation and usability, ensuring precise and efficient sample preparation and 3D analysis.
By streamlining operations with fully automated functions, AMBER 2 reduces complexity for all users. Its advanced automation capabilities allow for routine sample preparation and overnight usage, significantly boosting lab productivity. The system also enhances materials surface characterization with an improved detection system and expands capabilities for prototyping applications such as electron beam lithography.
Newly Enhanced Features of TESCAN AMBER 2
Leveraging an AI-driven approach and an extensive material library, AMBER 2 ensures reliable, fully automated sample preparation across a wide range of materials. Additionally, the integration of a beam blanker on the new generation BrightBeam™ SEM column facilitates effective nanoprototyping through electron beam lithography. AMBER 2 also serves as an excellent entry point for those looking to perform FIB-SEM characterization from micron scale to the nanoscale.
Key Features of TESCAN AMBER 2
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Enhanced Automation: Fully automated processes minimize user intervention and maximize efficiency.
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User-Friendly Interface: Intuitive design for both beginners and advanced users.
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Overnight Operation: Performs automated tasks overnight, increasing lab productivity.
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Precise Sample Preparation: Maintains high resolution and accuracy in sample preparation and imaging.
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Optimized Prototyping: Expands possibilities for prototyping techniques.
Launch of Two New Tools: AURA Gentle Ion Beam and TEM AutoPrep Pro™
Alongside AMBER 2, TESCAN introduces AURA Gentle Ion Beam and TEM AutoPrep ProTM.
TESCAN AURA Gentle Ion Beam
AURA Gentle Ion Beam sets a new benchmark for TEM specimen preparation. The AURA Gentle Ion Beam system enhances TEM specimen preparation by integrating established Argon ion beam technology, efficiently operating at typical energies as low as 200 eV. This ensures minimal amorphization damage and preserves the crystalline structure of samples, crucial for high-resolution STEM/TEM imaging. It integrates seamlessly with TESCAN FIB-SEMs, offering ultra-thin specimen preparation with superior quality and efficiency.
TESCAN TEM AutoPrep ProTM
TEM AutoPrep Pro™ software leverages AI and TESCAN Essence™ software to automate TEM sample preparation, accommodating diverse materials and enabling unattended operations. This system enhances productivity by automatically performing tasks such as milling, lift out, trimming, and polishing during overnight runs, ensuring high-quality TEM lamellae with minimal training or interaction required.
Join the Launch at M&M 2024
The official launch of the TESCAN AMBER 2 will be among the many highlights of the M&M 2024 Expo in Cleveland, Ohio. If you’re attending, as you definitely should, don’t miss out on the chance to see this advanced system in action. You can book a demo, attend presentations, and participate in talks to understand how AMBER 2 empowered by the new tools can revolutionize your research.
So, mark your calendars and get ready to explore the future of nanocharacterization with TESCAN AMBER 2. We can’t wait to see how this new technology will advance materials research and make your lab work more efficient than ever before.
Join our Webinar Series starting in September
To get you acquainted with the latest additions to the rich TESCAN portfolio, we are in the middle of preparing a new round of webinar sessions on the AURA Gentle Ion Beam, the TEM AutoPrep ProTM and the TESCAN AMBER 2.
Stay tuned for more!