Webinar: Gain the Maximum Throughput with Artifact-Free Surfaces for Sample Characterization by Using High Current Plasma FIB-SEM

Back by Popular Demand: Dive Deeper into Material Sciences with TESCAN's Expert-Led Webinar

 

Due to heightened demand, we're thrilled to announce the return of a webinar on Plasma FIB-SEM sample characterization, now with the opportunity for live interaction. Join us for a fresh take on a topic that captivated many last year, complete with live opening remarks and an engaging Q&A session to wrap things up.

 

Webinar Title: Gain the Maximum Throughput with Artifact-Free Surfaces for Sample Characterization by Using High Current Plasma FIB-SEM

Presenter: Martin Sláma

Date & Time: June 4th 9 a.m. @ 5 p.m. CEST

Register Here

 

Explore the Cutting-Edge Techniques in FIB-SEM

Our webinar will delve deep into the advanced methodologies of using plasma FIB-SEM for material analysis. This session aims to enhance your understanding of sample preparation and characterization, offering insights into maximizing efficiency without sacrificing quality. Key takeaways include:

  • Efficiency in Material Removal: Learn how high current ion beams can expedite the preparation of large samples.

  • Enhanced Surface Polishing: Discover techniques for polishing large surface areas to reveal intricate details about the material structure.

  • Advanced Analysis: Understand how plasma FIB-SEM can be used to link microscale and nanoscale characterizations.

  • Technological Innovations: Get acquainted with TESCAN’s TRUE X-Sectioning and Rocking Stage technologies that minimize artifacts.

  • Improvements in 3D Tomography: See how these methods enhance 3D FIB-SEM tomography for a better understanding of material properties.

 

Your host, Martin Sláma, is the Product Marketing Manager at TESCAN ORSAY HOLDING, bringing over eight years of expertise in material and life sciences. His deep understanding of the intricacies of FIB-SEM technologies and dedication to advancing material characterization make him a distinguished guide for this seminar.

 

Why You Should Attend

Participants in this webinar will gain invaluable insights into optimizing their use of FIB-SEM for various scientific and industrial applications. Whether you're a seasoned professional or new to the field, you'll leave with a deeper understanding of how to apply these techniques to achieve artifact-free surfaces and detailed sample analysis. 

 

This session is not just about learning new skills - it's about elevating our understanding of material characterization.

 

Ready to Elevate Your Expertise?

Don't miss out on this unique opportunity to interact directly with Martin Sláma, our expert on material characterization techniques. Register now and secure your spot in this exclusive webinar. 

 

Registration was closed

 

Join us to ensure you're at the forefront of material science innovation!

 

Questions?
Want a virtual demo?

Our global team is available to answer questions about TESCAN FIB-SEMs and other solutions from TESCAN.