Join TESCAN for an in-depth webinar showcasing the groundbreaking advancements in 3D multimodal characterization with the TESCAN AMBER X2
Re-watch our session to discover how this state-of-the-art Plasma FIB-SEM system is setting new standards in speed, precision, and high-throughput data acquisition, effectively addressing the challenges of balancing data quality and volume in 3D materials analysis.
This webinar highlights the innovative features of the TESCAN AMBER X2, focusing on its ability to enhance 3D FIB-SEM tomography, optimize data acquisition speed, and maintain high-quality results in various research applications.
The session covers the integration of 3D FIB-SEM tomography with material structure and properties, strategies to overcome common challenges in tomography, and the detailed capabilities of the TESCAN AMBER X2, including the Mistral™ Plasma FIB and advanced detectors like EDS, EBSD, and ToF-SIMS.
Meet the Host
Tomáš Šamořil, Product Marketing Manager at TESCAN, with a PhD in Physical and Materials Engineering and extensive experience as an Application Specialist, will guide you through the latest developments in 3D multimodal characterization.
Watch the replay of the webinar here!