Webinar: Precision Nanoprototyping with TESCAN AMBER 2

Join TESCAN for an engaging webinar that highlights the advanced capabilities of the TESCAN AMBER 2 in precision nanoprototyping.

Re-watch our session to discover how this versatile FIB-SEM system empowers rapid development of novel devices through streamlined workflows and comprehensive analysis capabilities.  

This webinar showcases the innovative features of the TESCAN AMBER 2, focusing on its integrated design that reduces downtime and enhances productivity in nanoprototyping tasks. Learn how the system’s field-free ultra-high resolution SEM column and high-resolution FIB enable versatile sample preparation, including tasks like electron beam lithography (EBL), focused ion beam (FIB) milling, and deposition. 

The session also explores real-world applications of the TESCAN AMBER 2 in creating cutting-edge devices such as plasmonic and magnonic antennas, electrical contacts, shaped 2D materials, and functional surfaces. Additionally, you’ll see how the system’s unmatched ultra-high resolution (UHR) imaging capabilities allow for thorough analysis within the same platform. 

Meet the Host 

Milos Hrabovsky, Product Marketing Manager for Nanoprototyping at TESCAN, with deep expertise in electron and ion beam patterning, depositions, enhanced etching, and microscope automation, will guide you through the essential features and practical applications of the AMBER 2 in accelerating device development. 

Watch the replay of the webinar here!