Pioneering Perspectives in Material Sciences

TESCAN Insights

Explore the FIB-SEM technologies and their practical applications within material sciences through our expert insights.

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FIB-SEM INVITATION matsci

TESCAN Launches AMBER 2: The Next Generation Gallium FIB-SEM

We have some exciting news from the world of scientific instrumentation. The launch of the next generation of our highly acclaimed AMBER platform is imminent: TESCAN AMBER 2, the fourth generation of the TESCAN gallium FIB-SEM platform and the successor...

A Deep Dive into Large Scale Xe PFIB/SEM Analysis of Shale

Tired of wrestling with limitations in large sample analysis?We get it. The milling rate of traditional Ga+ FIB-SEM is not sufficient for today’s challenges in materials science. But what if you could unlock nanometer-resolution insights across...

Webinar: Gain the Maximum Throughput with Artifact-Free Surfaces for Sample Characterization by Using High Current Plasma FIB-SEM

Back by Popular Demand: Dive Deeper into Material Sciences with TESCAN's Expert-Led Webinar

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