Enhance the clarity and precision of your high-resolution (S)TEM investigations with the integrated Gentle Ion Beam™ system.
Key Features:
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Ultra-thin TEM specimens with minimal amorphization and intermixing
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Removal of surface contamination and Ga-implanted zones for pure STEM analysis
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Seamless in-situ TEM lamella preparation within FIB-SEM
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Recipe-based automated processing for reproducible and efficient workflows
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Integrated STEM-in-SEM for quality endpoint inspection
Why Choose TESCAN Aura™?
TESCAN Aura™ enables precise post-FIB TEM specimen polishing inside the FIB-SEM vacuum chamber, minimizing degradation risks and streamlining your workflow. Designed for researchers demanding the highest sample quality, this solution ensures optimal results for even the most challenging materials.
Thank you for Your interest.