TESCAN recognized for advancing plasma FIB workflows with 2025 R&D 100 Award

TESCAN has received a 2025 R&D 100 Award in the Analytical/Test category for its TESCAN AMBER X 2, Powered by Mistral™ Plasma FIB column. The recognition highlights how this platform reshapes nanoscale research workflows by combining large-scale 3D materials characterization with precise TEM specimen preparation in a single system.

Now in its 63rd year, the R&D 100 Awards are among the most respected global honors for science and innovation. Winners are selected by an international judging panel of industry experts who evaluate novelty, impact, and practical applications across fields from materials science to energy.

The TESCAN AMBER X 2 introduces a new Mistral™ Plasma FIB column designed to unite high-throughput volume milling and the fine precision required for sub-30 nm TEM specimen fabrication. Researchers no longer need to rely on separate plasma FIB and gallium FIB-SEM systems, as both capabilities are integrated into one workflow.

The Mistral™ column delivers Xe+ ions with exceptional resolution across high and low energies, enabling clean thinning of TEM specimens without Ga+ contamination. Coupled with the BrightBeam™ 2 SEM column, the platform supports advanced imaging modes and multimodal integration, including EDS, EBSD, and TOF-SIMS, within a unified 3D tomography workflow.

This combination opens new possibilities in semiconductor research, energy storage materials, and nanostructure analysis by accelerating the path from bulk sample to nanoscale insight.

For TESCAN, the award affirms its ongoing transformation from instrument maker to a solution-driven enabler of scientific discovery. By reducing workflow complexity, minimizing transfer steps, and integrating multimodal analysis, AMBER X 2 demonstrates how outcome-oriented engineering serves the practical needs of research labs worldwide.

The awards will be presented at a ceremony on November 20, 2025, at the Marriott at McDowell Mountains in Scottsdale, Arizona.