Our Role in the Success of MC2023
From February 26th to March 2nd, MC2023 brought together leading experts and emerging researchers across various fields, such as Materials Science, Life Sciences, Instrumentation, and Methods. The event provided a platform to deliberate on current trends and explore new discoveries.
TESCAN took the stage with a comprehensive 60-minute talk titled "The Role of Electron Microscopy and Focused Ion Beam Characterization Methods in the Evaluation of Electrochemical Materials and Their Interphases." This presentation highlighted TESCAN's contribution in improving the analysis of battery materials.
Furthermore, we showcased two booths spotlighting our AMBER X plasma FIB-SEM, a critical tool for the analysis of battery technology. Equipped with integrated ToF-SIMS solution, AMBER X demonstrated the advancements TESCAN has made in the field.
Thanking our Audience at MC2023
Our heartfelt thanks go out to everyone who visited and engaged with us during the event, exploring our solutions for battery advancement.
For a deeper look into our AMBER X plasma FIB-SEM and other TESCAN solutions, we invite you to visit our website. Stay tuned for more updates on upcoming events and advancements from TESCAN!
