Advanced Material Characterization Techniques: TESCAN at Istanbul Technical University

Things are getting personal - we’re excited to partake in a hands-on workshop on Advanced Material Characterization Techniques with SEM, FIB-SEM, STEM, and MicroCT. This workshop, designed for researchers and scientists pushing the boundaries of material science, will be held at Istanbul Technical University on Wednesday, May 29th, 2024.

The program boasts a lineup of distinguished speakers like Dr. Tomáš Šamořil and Dr. Daniel Němeček, who will delve into topics like correlative FIB-SEM characterization and nanoscale characterization with advanced microscopes.

Here's a glimpse into the program:

• 09:00-09:30: Welcome Speech
• 09:30-10:30: Correlative FIB-SEM Characterization for Advancing Materials Science Research - Dr. Tomáš Šamořil
• 10:30-11:00: Coffee Break
• 11:00-12:00: Pushing Characterization of Materials to the Nanoscale with a Modern Multimodal Analytical STEM Microscope - Dr. Daniel Němeček
• 12:00-13:00: Lunch Break
• 13:00-14:00: Advanced 3D and 4D Imaging for Structural and Compositional Analysis in Battery Development and Materials Science - Dr. Wesley De Boever
• 14:00-14:30: Coffee Break
• 14:30- 15:30: Surface and Subsurface Characterization of Lithium-Ion Battery Materials Using FIB-SEM with Integrated TOF-SIMS - Dr. Tomáš Šamořil
• 15:30-16:30: Questions & Answers

Want to know more?
Follow this link for a detailed program and speaker information! https://docs.google.com/forms/d/1Mk9LwrOHXN5nrpBrw65A_HW20IA_SUl3xHhnTlLUgnI/viewform?pli=1&pli=1&edit_requested=true

This workshop promises to be a valuable platform for researchers to gain insights into groundbreaking material characterization techniques. We look forward to fostering discussions and collaborations in the field!