Pioneering Advances in Semiconductor Analysis
Gain new insights into semiconductor technology with our webinar. Learn about the advanced features of the TESCAN SOLARIS X, crafted to improve your analysis workflows.
This session covers the sophisticated capabilities of TESCAN SOLARIS X, emphasizing its ability to conduct fast, large-area sectioning and sample preparation without the negative effects of Ga+ ion exposure. Detailed applications of Plasma FIB-SEM technology are presented, focusing on the examination and enhancement of semiconductor materials and their performance.
Key topics include the integration of high-resolution endpointing techniques, essential for understanding material behaviors and supporting the development of more efficient and high-performing semiconductor technologies.
Meet the Host
Lukas Hladik, Product Marketing Manager at TESCAN Group, is an expert in semiconductor technology and analysis, bringing a wealth of knowledge to semiconductor research and development.
Watch the recording to gain valuable insights into overcoming the challenges of semiconductor sample analysis and improve your technical knowledge with TESCAN SOLARIS X.