BOOK YOUR DEMO HERE
TESCAN's 4D-STEM, redefining nanoscale multimodal characterization with synchronized diffraction imaging, EDS acquisition, beam blanking, and real-time data processing. TENSOR is as easy to use as an SEM — bringing true structural, morphological, and chemical analysis within reach of all researchers.
TESCAN TENSOR
Booking via this form is no longer available. If you are interested in scheduling a demo, please visit our booth No. 301 at the info counter. Our team will be happy to assist you in finding an available slot. Thank you for your understanding!
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The first dynamic micro-CT with true submicron resolution for non-destructive 3D imaging. See it in action and discover how UniTOM HR captures fine structural detail and supports advanced, in-situ materials characterization. A new standard in high-resolution, real-time micro-CT.
TESCAN UniTOM HR
Booking via this form is no longer available. If you are interested in scheduling a demo, please visit our booth No. 301 at the info counter. Our team will be happy to assist you in finding an available slot. Thank you for your understanding!
Experience the latest VR demonstration of NanoSpace, the first UHV designed FIB-SEM instrument, fully bakeable to reach ultimate vacuum level.
NANOSPACE by Orsay Physics
Booking via this form is no longer available. If you are interested in scheduling a demo, please visit our booth No. 301 at the info counter. Our team will be happy to assist you in finding an available slot. Thank you for your understanding!
TESCAN MIRA XR: New TESCAN Ultra-High-Resolution SEM
Micro CT
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Micro CT
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Micro CT
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POSTER
POSTER: Martin Slama: The impact of applied ion energy on low-damage (S)TEM sample preparation caused by various ion species in FIB-SEM.
Micro CT
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POSTER
POSTER: Tomáš Šamořil (author); Petr Klímek (presenter): Surface and Subsurface Characterization of Lithium-Ion Battery Materials Using FIB-SEM with Integrated ToF-SIMS and 3D ToF-SIMS Tomography
Micro CT
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POSTER
POSTER: Jana Šmídová: Employing Xe Plasma FIB for Fast and Precise Sample Preparation.
Micro CT
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LinkedIn Profile
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LinkedIn Profile
Dr. Yongkai Zhou had working experience with top 5 world EM producers and GlobalFoundries, taking various roles doing Electron Microscopy related businesses. He has vast experience in TEM, FIB, SEM, and MicroCT applications for materials science research and semiconductor failure analysis.
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Jérémie Silvent is the Sales Manager for Orsay Physics and Product Sales Leader for all the Orsay Physics products, including subsystems and OEM business. He is working for TESCAN Group since 2016. Before, Jérémie did multiple post-doctorate research projects where he specialized in cryo-SEM and cryo-FIB SEM.
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Enthusiastic and experienced product and marketing manager of TEM/STEM microscopes with over 4-years of experience managing mid-range TEM products from market analysis to product conception, development and release.
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LinkedIn Profile
Product marketing manager for FIB-SEM 3D characterization and TEM lamela preparation in Materials science with over 8 years experienceworking with FIB-SEM instruments.
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LinkedIn Profile
Lucie (Customer Solutions Specialist) brings rich customer service experience, mainly from the area of logistics and planning. Her main responsibility is service-product management.
Dirk van der Wal is acting Chief Marketing Officer, and Liaison Officer for TESCAN White Label partners in Japan and China. His experience includes applications, product management and product marketing of charged particle optics instruments (SEM, STEM, FIB and micro-CT), primarily in the fields of Materials Science incl. Batteries, Geosciences, and Process Mineralogy (Automated Mineralogy).
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