Webinar Announcement: Mastering Semiconductor Analysis with TESCAN SOLARIS X

Elevate Your Analysis Game in the Semiconductor Arena

As the semiconductor industry races towards ever-greater feats of integration, density, and miniaturization, staying ahead of the curve is a must. Mark your calendars for March 5th, 2024, as we invite you to a new webinar that will change the way you approach semiconductor sample analysis.

Webinar Title: "Increase Throughput and Quality of Your Semiconductor Deep Cross Sections, Ga+ Free TEM Samples, and Delayering with TESCAN SOLARIS X" 

 

Date and Time: March 5th, 2024, from 9 A.M. and 5 P.M.

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What to Anticipate: 

  • Industry Evolution Insights: Gain a comprehensive understanding of the semiconductor industry's pursuit of miniaturization and high-density integration. Discover how these trends are reshaping device functionality, speed, and power consumption. 
  • Technological Deep Dive: Learn all about TESCAN SOLARIS X, a system that stands out for its ability to perform fast, large area sectioning and sample preparation without the adverse effects of Ga+ ion exposure.  
  • Practical Demonstrations: Experience live demonstrations showcasing TESCAN SOLARIS X's proficiency in handling a broad array of complex samples, from OLED display components to 14 nm FinFET CPU materials, and more.

 

Why You Should Join: 

From the latest advancements in semiconductor analysis to demonstrations of the right tools to enhance throughput and quality, participants will walk away with valuable insights into overcoming the challenges of semiconductor sample analysis. 

Don't miss out on this opportunity to elevate your semiconductor analysis workflows with TESCAN SOLARIS X.

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Reserve your spot today

 

This online event hosted by Lukas Hladik, Product Marketing Manager at TESCAN Group, is set to unveil the robust capabilities of TESCAN SOLARIS X, a Plasma FIB-SEM platform for deep sectioning and the highest resolution end-pointing for package level failure analysis.