Smarter FIB-SEM Workflows for Every Lab
Advanced electron microscopy demands precise, reproducible sample preparation. Tescan’s latest automation tools, TEM AutoPrep™ Pro and AutoSection™, make complex tasks easier, faster, and more reliable. These solutions expand access to advanced workflows, improve throughput, and free skilled operators to focus on higher-value work.
TEM AutoPrep™ Pro
Automated TEM sample preparation – consistent, scalable, and effortless
TEM AutoPrep™ Pro transforms TEM lamella preparation into a fully automated process. Integrated with Tescan’s Essence™ platform, it enables unattended, overnight operation and delivers high-quality results with minimal manual input.
Key capabilities:
- Automated lift-out and polishing, including plan-view and inverted geometries
- Real-time monitoring and AI-driven error correction for safe, consistent operation
- Smart step recognition and material libraries to reduce optimisation time by up to 66%
- Up to 95% success rate in lamella preparation across diverse materials
- Throughput gains of up to 60% with overnight batch workflows
Whether scaling productivity or lowering the training barrier, TEM AutoPrep™ Pro makes high-quality TEM prep accessible to every lab.
AutoSection™
Automated cross-sectioning, optimized for quality and efficiency
AutoSection™ streamlines cross-section preparation with intuitive automation for both routine and advanced workflows. From hard ceramics to delicate MEMS devices, it delivers speed and accuracy across a wide range of samples.
Key capabilities:
- Automated cross-sectioning with rocking polishing for cleaner surfaces
- Feature-based endpoint detection for precise ROI targeting
- Ability to prepare multiple cross-sections overnight without supervision
- Integration with optical, CAD, or micro-CT inputs for accurate navigation and targeting
- Reduced training time and simplified use for less experienced operators
AutoSection™ helps labs maximize microscope utilization, improve reproducibility, and lower operational costs by running unattended and scalable workflows.
Why It Matters
Together, TEM AutoPrep™ Pro and AutoSection™ demonstrate Tescan’s commitment to democratizing advanced FIB-SEM workflows. They enable labs to:
- Boost throughput and microscope ROI
- Reduce dependency on highly specialized operators
- Maintain consistency across challenging materials
- Extend system use beyond staffed hours
Discover More
See how Tescan automation is reshaping sample preparation for materials science and semiconductor research.