EMC European Microscopy

Congress 2024 

Copenhagen, Denmark denmark, from August 25 till 30, 2024

Meet us now...
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TESCAN at EMC 2024: Launch of TESCAN AMBER X 2

 

Visit TESCAN Booth #B9 where you can explore a variety of our latest innovations

 

The TESCAN Global Team is thrilled to announce our participation at the European Microscopy Congress (EMC) 2024 in Copenhagen, Denmark, from August 25 to 30. We look forward to connecting with you at this premier event and sharing our latest advancements in microscopy.

 

Launch of TESCAN AMBER X 2

We are particularly excited to unveil the TESCAN AMBER X 2, our newest plasma FIB-SEM system, at EMC 2024. Join us for a live demonstration of this groundbreaking technology and discover how it can elevate your research in materials science.

 

Key Features of TESCAN AMBER X 2

 

  • Enhanced Plasma FIB Column: Experience superior profiles with optimized beam parameters, improving resolution, navigation, and milling performance.
  • Field-Free SEM Column: Achieve high-resolution imaging of diverse materials without the limitations of immersion optics, offering a wide field of view and various scanning modes.

  • Multimodal and Multiscale Analysis: Utilize unique 3D methods like real-time 3D ToF-SIMS for detailed elemental composition analysis, crucial for next-generation battery research.

Book your demo spot on TESCAN AMBER X 2!

 

Don’t miss this opportunity to witness the forefront of microscopy technology. Book a live demo of TESCAN AMBER X 2 at our booth and experience the cutting-edge advancements firsthand.

 

 

TENSOR 4D-STEM

 

Experience the capabilities of the TENSOR 4D-STEM, designed for multimodal nano-characterization. This technology excels in morphological, chemical, and structural analysis, making it essential for materials scientists, semiconductor R&D, failure analysis engineers, and crystallographers.

 

Book your demo spot for TENSOR!

 

 

New Generation TESCAN CLARA UHR SEM

 

Discover the CLARA UHR SEM’s fast, accurate, and comprehensive nanoscale surface analysis across a wide range of materials. See firsthand how it can bring new insights into your samples. Take an opportunity to discuss your needs with our expert or visit our website.

 

TESCAN UniTOM HR

 

Be amazed by the UniTOM HR, a versatile micro-CT system that combines high spatial resolution with impressive temporal resolution, suitable for both static and dynamic imaging. This state-of-the-art equipment meets all your microscopy imaging needs.

 

Book your demo spot for UniTOM HR!

 

Battery Research Analytical Workflow

 

Explore our optimized FIB-SEM solution for lithium-ion battery characterization. Learn how the combination of high-current FIB, field-free UHR SEM, and integrated ToF-SIMS can advance your battery research.

 

Life Sciences Innovations

 

Engage with our Life Sciences experts to discuss 2D and 3D characterization of biological samples. Learn about plasma FIB for overcoming Cryo-ET sample preparation bottlenecks, and ultra-fast cryo on-grid lamella preparation and lift-out from challenging samples.

 

 

We eagerly await your visit to our booth #B9 at EMC 2024. Let’s connect and explore the future of microscopy together!

Live Demo

TENSOR with cabinets-2

TESCAN TENSOR

Experience an exclusive TENSOR demo. The first near-UHV 4D-STEM for multimodal nano-characterization.

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TESCAN TENSOR

For demo bookings please contact our booth reception. We will try to accommodate your needs.

TESCAN-AMBER-MS-4-1500px

TESCAN AMBER X 2 - NEW!

Check out our new product Versatile nanoanalytical FIB-SEM with Gentle Ion Beam.

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AMBER X 2 MISTRAL COLUMN – NEW!

For demo bookings please contact our booth reception. We will try to accommodate your needs.

XT4F0167b2 kopie

TESCAN MIRA G4

Explore TESCAN MIRA at GATAN booth no. B11  This system provides an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs.

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MIRA G4

For demo bookings please contact our booth reception. We will try to accommodate your needs.

UniTOM-HR_tescan-1024x576 (1)

TESCAN UniTOM HR

Micro-CT with sub-micron resolution and dynamic imaging capabilities, it offers unprecedented insights into your samples. Experience the future of 3D imaging firsthand – register for your demo today!

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MicroCT UniTOM HR

For demo bookings please contact our booth reception. We will try to accommodate your needs.

Learn with us

 

Scientific talk

Thursday August 29
10:30 AM - 12:30 PM
A-cryo-workflow-combining-light,-electron-and-soft-x-ray-microscopy-provides-targeting-of-unlabeled-features2

A cryo workflow combining light, electron and soft x-ray microscopy provides targeting of unlabeled features

 

Author: Jakub Javůrek

Martina-Zánová
by Martina Zánová
Lecture Theatre 4
29 August, 10:30 - 12:30
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Micro CT

Registration form

Scientific talk (customer story)

Tuesday August 27
10:30 AM - 12:30 PM
Hyperspectral-CT-allows-for-non-destructive-elemental-imaging-in-museum-specimen-3

Hyperspectral CT allows for non-destructive elemental imaging in museum specimen

 

Co-author: Michiel Krols, TESCAN XRE

Henrik-Lauridsen
by Henrik Lauridsen, Department of Clinical Medicine, Aarhus University
Lecture Theatre 3
27 August, 10:30 - 12:30
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Micro CT

Registration form

Poster session

Thursday August 29
10:30 AM - 12:30 PM
A-Comprehensive-Tool-for-Automated-4D-STEM-Multimodal-Analysis-and-Method-Development2

ExpertPI: A Comprehensive Tool for Automated 4D-STEM Multimodal Analysis and Method Development

 

Author: Daniel Němeček

Daniel-Němeček
by Daniel Němeček
Poster Area
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Micro CT

Registration form

Poster session

Monday August 26
04:00 PM - 06:30 PM
Leveraging-FIB-SEM-with-Integrated-ToF-SIMS-for-Comprehensive-Characterization-of-Lithium-Ion-Battery-Materials2

Leveraging FIB-SEM with Integrated ToF-SIMS for Comprehensive Characterization of Lithium-Ion Battery Materials

 

Author: Tomáš Šamořil

Tomáš-Šamořil
by Tomáš Šamořil
Poster Area
Monday - Tuesday, 26-27 August, 16.00-18.30
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Micro CT

Registration form

Poster session

Wednesday August 28
04:00 PM - 06:30 PM
Raman-SEM-correlation

Leveraging FIB-SEM with Integrated ToF-SIMS for Comprehensive Characterization of Lithium-Ion Battery Materials

 

Author: Tomáš Šamořil

Tomáš-Šamořil
by Tomáš Šamořil
Poster Area
Wednesday - Thursday, 28-29 August, 16.00-18.30
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Micro CT

Registration form

Lunchtime Lectures

 

Lunch Company Workshop

Monday August 26
12:45 PM - 01:15 PM
AMBER-X-2
TESCAN AMBER 2 and TESCAN AMBER X 2:
New Generation FIB-SEMs for Speed, Utility, Precision
Martin Slama photo
by Martin Sláma
Lecture Theater 2
Monday 26 August, 12:45 – 13:15 (30 minutes)
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Micro CT

Registration form

Flash presentation

Wednesday August 28
12:45 PM - 01:05 PM
LAMELLA
Advanced TEM Sample Preparation for Materials Research
Martin Slama photo
by Martin Sláma
Lecture Theater 3
Wednesday 28 August 12:45 – 13:05 (20 Minutes)
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Micro CT

Registration form

Where to meet

Bella Center Copenhagen

Center Blvd. 5,

2300 København,

Denmark

Not attending?

 

If you are unable to attend this conference, we will be happy to contact you, if you have any questions or requests.

Photos and videos from past TESCAN global events