TESCAN is excited to announce our participation in the Microscopy & Microanalysis (M&M) 2024 conference, taking place from July 29 to August 1 in Cleveland, Ohio, USA.
This esteemed event is a key gathering for experts in microscopy and microanalysis, and we are eager to showcase our latest advancements and contributions to the scientific community. This year, we are especially thrilled to unveil TESCAN AMBER 2, the much-anticipated upgrade to our AMBER Series.
Experience the Future of Microscopy
Visit us at booth 521 to see our demo systems, including TESCAN AMBER 2, TESCAN CLARA, TESCAN TENSOR, and TESCAN micro-CT.
Our team of experts will be available to provide live demonstrations, answer your questions, and discuss how our innovative solutions can enhance your research and development workflows.
Official Launch of TESCAN AMBER 2
We are excited to announce the official launch of the TESCAN AMBER 2 at M&M 2024. The launch event will take place on July 29 at our booth (No. 521).
This is your chance to meet the developers of this advanced FIB-SEM system and explore its capabilities. AMBER 2 offers exceptional speed, precision, and versatility for comprehensive sample preparation and characterization.
Discover Our Latest Tools: TESCAN AURA Gentle Ion Beam ™ and TEM AutoPrep Pro™
Alongside AMBER 2, we are introducing two new tools designed to enhance TEM sample preparation:
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TESCAN AURA Gentle Ion Beam™: This system minimizes gallium FIB induced damage in TEM specimen preparation, ensuring minimal amorphization damage and preserving the crystalline structure of samples.
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TESCAN TEM AutoPrep Pro™: This software automates and optimizes the entire TEM sample preparation process, boosting productivity by performing tasks such as milling, lift out, trimming, and polishing during unattended overnight runs.
Attend Our Scientific Presentations
Our team will be presenting several scientific contributions during the conference. Be sure to attend these sessions to gain new insights and learn about the latest advancements in microscopy and microanalysis:
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Spectral micro-CT imaging of minerals retrieving atomic information and density maps
Date & Time: Monday, July 29, 2024, 3:00 – 5:00 PM
Location: Exhibit Hall Poster Board 7
Presenter: Wesley De Boever, Ph.D.
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A New Fully Integrated Retractable 4D STEM Detector for Scanning Electron Microscopes Using Timepix3 Based Pixelated Detector
Date & Time: Monday, July 29, 2024, 3:00 – 5:00 PM
Location: Exhibit Hall Poster Board ?
Presenter: Rastislav Motuz
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Battery electrolyte behavior during formation and heating: new insights using high-resolution and dynamic micro-CT
Date & Time: Tuesday, July 30, 2024, 11:45 AM – 12:00 PM
Location: Huntington Convention Center Room 19
Presenter: Ksenija Nikolic, Ph.D.
Schedule a Meeting with Our Customer Service Team
Our customer service team will be available throughout the conference to discuss your specific needs and how TESCAN’s solutions can support your research and development efforts.
Schedule a meeting with our team to get the most out of your visit to M&M 2024.
Visit Us at Booth 521
We invite you to visit our booth, book a demo slot, and learn all about TESCAN AMBER 2 and our new tools. Don’t miss this opportunity to engage with our experts and see firsthand how TESCAN is advancing the field of microscopy and microanalysis.
For more information about TESCAN AMBER 2 and our new tools, please visit our website: https://info.tescan.com/matsci-fib-sem/tescan-amber-2