The International Conference on Materials for Advanced Technologies (ICMAT) is a leading global platform for materials science, bringing together top researchers and innovators to exchange the latest developments in the field. Held biennially in Singapore, ICMAT 2025 continues this tradition of excellence by showcasing cutting-edge research across functional, structural, and emerging materials.
Join TESCAN at ICMAT 2025 to discover how our advanced solutions are accelerating innovation in materials science.
TESCAN’s advanced solutions empower materials researchers to explore, prototype, and analyze across the full resolution spectrum — from nanoscale characterization and prototyping with TESCAN FIB-SEM to advanced structural and functional analysis with TESCAN TENSOR, and non-destructive 3D imaging down to 600 nm with TESCAN Micro-CT. For specialized applications, Orsay Physics delivers tailored ion and electron beam technologies to meet the most demanding research needs.
TESCAN empowers both academic and industrial researchers with high-performance tools for:
Fast and large area 2D/3D nanoscale characterization
TESCAN AMBER X 2
Automated TEM lamella preparation with minimal damage
TESCAN AMBER X 2 with AutoPrep Pro™
TESCAN AMBER 2 with AutoPrep Pro™ & AURA™ Gentle Ion Beam for ultra-thin HR-(S)TEM samples
Advanced analytical STEM
TESCAN TENSOR with 4D-STEM and 3D-ED workflows for in-depth structural and functional analysis
Non-destructive 3D/4D imaging
TESCAN Micro-CT for internal structure visualization down to 600 nm resolution
Tailored beam technologies for specialized research
Orsay Physics – Deterministic ion implantation with Quiin, and precise nanofabrication and contamination-free analysis with Nanospace
Stop by Booth C11 to discuss how TESCAN’s advanced solutions can support your research!