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Webinar: Introducing TESCAN AMBER X 2 and AMBER 2 - The Next Generation of FIB-SEMs

Join us to explore the revolutionary advancements in FIB-SEM technology with the launch of TESCAN AMBER X 2 and AMBER 2

 

Join us to explore the revolutionary advancements in FIB-SEM technology with the launch of TESCAN AMBER X 2 and TESCAN AMBER 2. Re-watch our webinar here and learn how these cutting-edge systems can elevate your materials analysis and TEM sample preparation to new heights. 

This webinar delves into the latest innovations in TESCAN’s FIB-SEM technology, focusing on the enhanced speed, precision, and versatility offered by the TESCAN AMBER X 2 and TESCAN AMBER 2 systems. 

The session covers TESCAN’s decade of FIB-SEM development, the unique advantages of the Mistral™ Plasma FIB, and real-world applications ranging from large-scale characterization to automated TEM sample preparation. 

 

Martin Slama photoMeet the Host 

Martin Sláma, Product Marketing Manager at TESCAN, with over 8 years of expertise in FIB-SEM 3D characterization and TEM lamella preparation, leads this insightful discussion on the new generation of FIB-SEMs. 

  

Watch the replay of the webinar here! 

Questions?
Want a virtual demo?

Our global team is available to answer questions about TESCAN FIB-SEMs and other solutions from TESCAN.