Webinar: Introducing TESCAN AMBER X 2 and AMBER 2 - The Next Generation of FIB-SEMs
Join us to explore the revolutionary advancements in FIB-SEM technology with the launch of TESCAN AMBER X 2 and AMBER 2
Join us to explore the revolutionary advancements in FIB-SEM technology with the launch of TESCAN AMBER X 2 and TESCAN AMBER 2. Re-watch our webinar here and learn how these cutting-edge systems can elevate your materials analysis and TEM sample preparation to new heights.
This webinar delves into the latest innovations in TESCAN’s FIB-SEM technology, focusing on the enhanced speed, precision, and versatility offered by the TESCAN AMBER X 2 and TESCAN AMBER 2 systems.
The session covers TESCAN’s decade of FIB-SEM development, the unique advantages of the Mistral™ Plasma FIB, and real-world applications ranging from large-scale characterization to automated TEM sample preparation.
Meet the Host
Martin Sláma, Product Marketing Manager at TESCAN, with over 8 years of expertise in FIB-SEM 3D characterization and TEM lamella preparation, leads this insightful discussion on the new generation of FIB-SEMs.
Watch the replay of the webinar here!
Questions?
Want a virtual demo?
Our global team is available to answer questions about TESCAN FIB-SEMs and other solutions from TESCAN.