Join us for an upcoming webinar that promises to bring new insights to semiconductor device analysis. Organized jointly by TESCAN Group and Imina Technologies, this session will delve into innovative methods for automated large-area Plasma FIB delayering and in-situ nanoprobing of advanced semiconductor devices.
Webinar Title: "Automated large-area Plasma FIB delayering & in-situ nanoprobing of the most current semiconductor devices"
Date & Time: June 12th ,2024 9 a.m. and 5 p.m. CEST