New systems enhance semiconductor research with automated TEM lamella preparation, advanced failure analysis, and precision delayering with in-situ electrical analysis.
Brno, Czech Republic, (DATE) – TESCAN GROUP, a global leader in scientific instrumentation, announces the launch of three advanced systems: SOLARIS 2, SOLARIS X 2, and AMBER X 2. These solutions are developed to meet the increasing demands of semiconductor failure analysis, offering automation, precision, and efficiency for sub-10 nm technology nodes and beyond.