Plasma FIB-SEM & IC Packaging Failure Analysis | TESCAN Insights

FA 4.0: Developing Advanced Failure Analysis Equipment and Methods

Written by Focused Ion Beam Team | Jun 14, 2023 8:31:00 PM

Incorporating Artificial Intelligence/Machine Learning (AI/ML) and Automation for Improved Defect Recognition and Efficiency

TESCAN is part of an ongoing project, set to conclude in September 2023, called Failure Analysis (FA) 4.0. This project is focused on addressing the reliability and safety challenges within the fast-paced electronic systems industry. As a significant participant, TESCAN has co-developed AI/ML-driven tools and methodologies for detecting and mitigating defects in electronic components and systems. This approach aims to refine the processes of design, manufacturing, and maintenance for high-tech products, enhancing Europe's role in smart mobility and industrial production.