Inspiration Paper
Deeper Insights
with the TESCAN MIRA XR
Discover the full potential of MIRA XR’s UHR imaging and advanced automation. Download our white paper to explore its capabilities in high-throughput research, failure analysis, and quality control.
Key Benefits of TESCAN MIRA XR
Faster, Ultra-High-Resolution Data
Dual Essence™ EDS and Extended Resolution technology enable rapid, high-quality imaging while reducing analysis time.
Efficient Sample Analysis
Wide Field Optics™ streamlines workflows by cutting time-to-data by up to 30%, allowing fast navigation to the areas of interest.
Seamless Handling
of Complex Samples
MultiVac™ mode ensures high-resolution imaging of beam-sensitive and outgassing materials even without surface metal sample coating.
Smart
Automation
In-Flight™ Automation Controls and Essence™ software operation, making advanced SEM imaging accessible to all users.
Near Real-Time
Multiscale Analysis
MIRA XR accelerates data acquisition and processing with fully integrated Dual Essence™ EDS, Wide Field Optics™, and In-Flight™ Automation. It reduces time to ultra-high-resolution SEM data by at least 30% compared to conventional systems.
Automated alignment and calibration routines ensure repeatable results with minimal user input, optimizing efficiency for both routine and advanced research applications.
Engineered for Excellence
Performance, applications, and usability: The MIRA XR is designed to boost imaging, analysis, and workflow automation in every lab. Explore how it optimizes every step of your workflow here.
Performance
at Every Scale
Designed for Academy and Industrial Labs
Smart Automation,
Seamless Control
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