Material Science FIB-SEM Academy Page

Advances in Specimen Preparation Workflows for S/TEM Analysis

Written by TESCAN FIB-SEM TEAM | Nov 20, 2024 1:12:18 PM

Lucille A. Giannuzzi from TESCAN Group presented TESCAN’s latest innovations in hardware, software, and automated workflows for preparing electron-transparent specimens for S/TEM analysis.