The TESCAN OptiGIS O₂ module introduces a powerful enhancement to the FIB-SEM workflow by leveraging targeted oxygen gas injection. When combined with the TESCAN Mistral™ plasma FIB, this system enables:
Faster Milling
Achieve up to 50% faster material removal in carbonaceous substrates—ideal for polymers, composites, and resin-embedded samples.
Superior Surface Quality
Reduce carbon redeposition and surface contamination, significantly improving SEM imaging clarity and consistency.
Selective Control in Non-Carbon Materials
For materials such as silicon and aluminum, OptiGIS O₂ enables precision slowing of milling rates, allowing researchers to fine-tune shape and depth without compromising resolution.
Plug-and-Play Integration
Seamlessly upgrade your existing TESCAN plasma FIB-SEM platform with minimal downtime or calibration.
Case Highlight:
In comparative imaging of epoxy-resin-embedded tissue, oxygen-enhanced milling using OptiGIS O₂ revealed smoother surfaces and clearer features—outperforming xenon-only techniques in both speed and imaging quality.
See How Oxygen-Enhanced Milling Transforms FIB-SEM Performance
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