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Performance
Dectris
Precession
Applications
4D-STEM
Measurements
Usability
Design
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Insights
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Home
Performance
Dectris
Precession
Applications
4D-STEM
Measurements
Usability
Design
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Insights
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TESCAN AMBER 2
Fully automated Ga FIB-SEM for routine sample preparation, nanoscale characterization, and comprehensive prototyping applications
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