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SerialED enables crystal structure determination even for very beam-sensitive samples by combining single-shot diffraction patterns from many crystals of the same compound or material. However, structure refinement requires huge datasets due to the inherent limitations of this approach. The efficiency and success rate of the Serial ED approach can be significantly boosted and accelerated by using beam precession, making this approach much more viable for structure determination of challenging samples.
The beam precession improves data quality by reducing the effects of dynamical scattering in acquired diffraction patterns while integrating the diffraction spots within the precession angle in the reciprocal space. Consequently, the number of crystals required for successful structure determination is significantly reduced while more accurate structure refinement is achieved.
Comparison of the conventional Serial ED and precession assisted Serial ED approaches using BaSOâ‚„ crystals as the test specimen
Achieved full data completeness (99%) with fewer patterns compared to the conventional Serial ED approach (only 62%)
Enabled dynamical refinement with accuracy down to the sub-Angstrom scale
Reduced R-factors and residuals by more than half compared to conventional SerialED
Provides a reliable approach for highly beam-sensitive samples, such as MOFs, organics and biological nanocrystals
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